Visualizing Trace Variants from Partially Ordered Event Data

Schuster, Daniel (Corresponding author); Schade, Lukas; van Zelst, Sebastiaan Johannes; van der Aalst, Wil M. P.

Cham, Switzerland : Springer (2022)
Contribution to a book, Contribution to a conference proceedings

In: Process Mining Workshops : ICPM 2021 International Workshops, Eindhoven, The Netherlands, October 31 - November 4, 2021, Revised Selected Papers / Jorge Munoz-Gama, Xixi Lu (eds.)
Page(s)/Article-Nr.: 34-46