A Remote Test Environment for a Large-Scale Microcontroller Laboratory Course

Smieschek, Manfred; Rakel, Stefan; Thönnessen, David; Derks, Andreas; Stollenwerk, André (Corresponding author); Kowalewski, Stefan

Cham : Springer (2020)
Contribution to a book, Contribution to a conference proceedings

In: Cyber physical systems : model-based design : 9th international workshop, CyPhy 2019 and 15th international workshop, WESE 2019, New York City, NY, USA, October 17-18, 2019 : revised selected papers / Roger Chamberlain, Martin Edin Grimheden, Walid Taha (eds.)
Page(s)/Article-Nr.: 231-246

Identifier