Similarity resonance for improving process model matching accuracy

Assy, Nour; van Dongen, Boudewijn F.; van der Aalst, Wil M. P.

ACM Press New York, New York, USA (2018) [Contribution to a book, Contribution to a conference proceedings]

Proceedings of the 33rd Annual ACM Symposium on Applied Computing
Page(s): 86-93

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