Similarity resonance for improving process model matching accuracy

ACM Press New York, New York, USA (2018) [Contribution to a book, Contribution to a conference proceedings]

Proceedings of the 33rd Annual ACM Symposium on Applied Computing
Page(s): 86-93

Authors

Authors

Assy, Nour
van Dongen, Boudewijn F.
van der Aalst, Wil M. P.

Identifier