Upper and Lower Tight Error Bounds for Feature Omission with an Extension to Context Reduction

New York, NY / IEEE (2018, 2019) [Journal Article]

IEEE transactions on pattern analysis and machine intelligence : TPAMI
Volume: 41
Issue: 2
Page(s): 502-514

Authors

Authors

Schlüter, Ralf
Beck, Eugen
Ney, Hermann

Identifier

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