Transformation of GRAFCET Into GAL for Verification Purposes Based on a Detailed Meta-Model

Mroß, Robin (Corresponding author); Schnakenbeck, Aron; Völker, Marcus; Fay, Alexander; Kowalewski, Stefan

New York, NY : IEEE (2022)
Fachzeitschriftenartikel (Review Article)

In: IEEE access
Band: 10
Seite(n)/Artikel-Nr.: 125652-125665