Generation of Invalid Test Inputs from Over-Constrained Test Models for Combinatorial Robustness Testing

Fögen, Konrad (Corresponding author); Lichter, Horst (Corresponding author)

Piscataway, NJ : IEEE (2020)
Buchbeitrag, Beitrag zu einem Tagungsband

In: 2020 IEEE 13th International Conference on Software Testing, Verification and Validation workshops : ICSTW 2020 : proceedings : 23-27 March 2020, Porto, Portugal / publisher: IEEE
Seite(n)/Artikel-Nr.: 171-180